Diffraction Anomalous Fine Structure: A New X-Ray Structural Technique

H. J. Stragier, J. O. Cross, J. J. Rehr, L. B. Sorensen, C. E. Bouldin and J. C. Woicik

A new x-ray structural technique, Diffraction Anomalous Fine Structure (DAFS), which combines the long-range order sensitivity of diffraction techniques with the short-range order sensitivity of absorption techniques, is described. We demonstrate that synchrotron DAFS measurements for the Cu (111) and Cu (222) Bragg reflections provide the same local atomic structural information as XAFS and describe how DAFS can be used to provide enhanced site and spatial sensitivities for polyatomic and/or spatially modulated structures.

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